Abstract
The technology of surface light scattering spectroscopy1 involves hardware issues in measuring accurately the surface elevation ζq(t), autocorrelation function or the corresponding spectrum, where q is the wave number of the capillary wave spectrum and ω the frequency. Major issues include the optimization of the optical signal to noise, minimization of environmental noise and deconvolution of Rq(t) from the instrument function. This last issue is of special interest when measuring scattering from small patches wherein qσ < 20, σ is the Gaussian beam width parameter, as is the case when used with Brewster angle microscopy in overlapping footprints.
© 1996 Optical Society of America
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