Abstract
Earlier we investigated the non-steady-state photo-EMF effect in PVK-based photorefractive polymer films in the conventional transmittance tilted configuration [1]. Here we apply this effect and dynamic TWM for the characterization of reflectance gratings in similar polymer films. Note that both experimental configurations utilize periodically phase-modulated recording beams and allow us to probe shifted and unshifted components of the space charge grating (by detecting fundamental and second harmonics (SH) in the output signals).
© 2001 Optical Society of America
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