Abstract

In several laboratories high-speed logic circuits which are capable of generating electrical pulses with risetimes in the order of ten picosecond have been demonstrated [1]. Consequently it is now important to be able to transmit these pulses without significant distortion and to be able to characterize the transmission line structures used for this purpose with picosecond time resolution. In addition to the delay and distortion of the pulses as they propagate between generating and receiving points, knowledge of the noise coupled onto adjacent lines is of critical importance to the workings of computers and communication systems. Here we present measurements of high-speed pulse propagation and coupling on an experimental thin film transmission line structure. Photoconductive switches are used for generating and sampling the ultrashort electrical pulses used in this study [2].

© 1987 Optical Society of America