Abstract
We report the development of a low-cost beam characterization technique appropriate for extremely low light levels. The technique makes use of compressive sampling strategies that have been developed recently for imaging applications.
© 2012 Optical Society of America
PDF ArticleMore Like This
Warren Grice, Duncan Earl, Philip Evans, Dong-Sheng Guo, Travis Humble, Eric Martin, and Raphael Pooser
FW4J.5 Frontiers in Optics (FiO) 2012
Thomas R. Clark, Keir C. Lauritzen, Matthew D. Sharp, Dennis G. Lucarelli, Patrick T. Callahan, and Michael L. Dennis
OW3I.1 Optical Fiber Communication Conference (OFC) 2012
P. G. Evans, R. C. Pooser, and J. Schaake
FTh4C.2 Frontiers in Optics (FiO) 2014