Abstract
A spatially-resolved spectroscopy is developed based on a time-domain tomography to measure the reflectance and transmittance of materials. Power transmittance of a known filter sample is measured as a demonstration of the system.
© 2013 Optical Society of America
PDF ArticleMore Like This
Masaya Sakatasume and Tatsutoshi Shioda
C669 Conference on Lasers and Electro-Optics/Pacific Rim (CLEO/PR) 2011
Chris A. Michaels, Yvonne B. Gerbig, Aaron M. Forster, and Robert F. Cook
AM1B.4 Applied Industrial Optics: Spectroscopy, Imaging and Metrology (AIO) 2013
Koichi Okamoto, Yoichi Kawakami, Masahide Terazima, and Axel Scherer
FMN4 Frontiers in Optics (FiO) 2004