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Material-specific imaging at the nanoscale using a 13.5 nm high-harmonic source

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Abstract

We present a high-harmonic-driven coherent extreme ultraviolet (EUV) microscope operating at 13.5 nm wavelength. Sub-20 nm resolution is demonstrated by utilizing a combination of structured illumination and a highly stable EUV source. We demonstrate the application of nanoscale EUV imaging to a variety of samples from life and material sciences.

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