Comparison of a two-wavelength pyrometer system and spectral pyrometry for high-temperature measurements

Sama Badr Aljohani; Sama Badr Aljohani; Sama Badr Aljohani; Ibrahim A. Alshunaifi; Naif B. Alqahtani; Bader A. Alfarraj

doi:10.1364/AO.522898

Applied Optics
Vol. 63,
Issue 13,
pp. 3648-3657
(2024)
•https://doi.org/10.1364/AO.522898

Comparison of a two-wavelength pyrometer system and spectral pyrometry for high-temperature measurements

Sama Badr Aljohani, Ibrahim A. Alshunaifi, Naif B. Alqahtani, and Bader A. Alfarraj

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Sama Badr Aljohani, Ibrahim A. Alshunaifi, Naif B. Alqahtani, and Bader A. Alfarraj, "Comparison of a two-wavelength pyrometer system and spectral pyrometry for high-temperature measurements," Appl. Opt. 63, 3648-3657 (2024)

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- Optical Devices, Sensors, and Detectors
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About this Article
History
- Original Manuscript: March 7, 2024
- Revised Manuscript: April 6, 2024
- Manuscript Accepted: April 6, 2024
- Published: April 26, 2024

Abstract

A pyrometer system is an optically passive, non-intrusive method that uses thermal radiation law to determine temperature. It combines electronic and optical instruments to detect low-level signals of radiation measurements. Surface high-temperature measurements are successfully obtained using a two-wavelength pyrometer system. This study used a pyrometer system to achieve high stability, minimize errors due to changing emissivity, and remove background noise from the radiation measurement for surface high-temperature measurements. Temperature measurements were also obtained from Planck’s model, and the results were compared with logarithmic assumption. The precision of these measurements is improved through variable optimization of the instruments, validation of the data, and calibration of the pyrometer system. The 16 temperature measurements were obtained (800–1600°C temperature measurement range) with a correlation coefficient above 97%. The response time between temperature readings is within 785 µs. Furthermore, the high-temperature measurements were obtained with higher stability (${\pm}{2.99}^\circ {\rm C}$ at 1600°C) and less error (less than 2.29% for Si sensor). In addition, the error of the temperature measurement was reduced from 5.33% to 0.86% at 850°C by using Planck’s model compared with using logarithmic assumption. A cooling system temperature is also optimized to reduce the error temperature reading. It was found to be at 10°C that the uncertainty was reduced from 2.29% at ambient temperature to 1.53% at 1600°C. The spectral pyrometry system was also used in comparison with the two-wavelength pyrometer system to confirm that the calibration curves of the spectral pyrometry can be used to determine temperature measurements.

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Data underlying the results presented in this paper are not publicly available at this time but may be obtained from the authors upon reasonable request.

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Technique	Advantages	Disadvantages	Example
Conduction measurements	• No calibration required • Easy to use	• Temperature ranges up to 1600°C • Approximately one year lifetime depending on the environment • Should clean probe occasionally to avoid measurement errors • Impact on the behavior of the fluid • Relatively long response time • One-point measurement only	Thermocouples
Radiation measurements	• Temperature ranges up to 3000°C depending on the calibration • Long-term lifetime • Non-intrusive method • Can measure in any environment • Fast response time • One-point and field measurements	• Relatively complex calibration of some systems • Known emissivity required for some systems	Pyrometer Infrared camera

Kind of Pyrometry System	Description	Reference
Fiber-optic two-color pyrometer system	Measuring temperature range from 300°C to 650°C with temperature errors at approximately 4%.	Tapetado et al. [15]
Two-color pyrometer system	Measuring temperature range from 800°C to 1100°C for an industrial furnace.	Bonefacic and Blecich [16]
Two-color pyrometer system	Measuring the temperature of the flame of copper concentrates. The temperature range was between 1600 and 2100 K.	Piceros et al. [17]
Two-color pyrometer system	Measuring temperature for molten ceramic stream.	Navello et al. [3]
Two-color pyrometer system	Measuring temperature range from 1600 K to 3280 K in a magnetized coaxial plasma gun (MCPG) using a thin tungsten material.	Sakuma et al. [18]
Two-color pyrometer system	Measuring temperature above 773 K using a gold-plated reflector. They determined that a gold-plated reflector reduced the error of the temperature measurement.	Che and Xie [19]
Two-color pyrometer system using a single camera	Characterizing the soot particles in diesel engines. They found that the errors were associated with the optical path length.	Reggeti et al. [10]
Two-pyrometer system using four CMOS sensors.	Measuring temperatures between 600°C and 2800°C in laser-based heating of metal processes. The main limitation of a two-color pyrometer using CMOS sensors is that it requires expert analysis of images (e.g., image processing).	Dagel et al. [13]
Two-color pyrometer system using two high-speed cameras	Obtaining 3D temperature measurements in a weakly turbulent diffusion flame. This method was limited by the signal-to-noise ratio in unsteady flames.	Yu et al. [20]

Lock-In Amplifier for S1		Lock-In Amplifier for S2		TGP110 10 MHz Pulse Generator
Switch	Setting	Switch	Setting	Switch	Coarse	Fine
Time constant	4	Time constant	4	Period	500 ms	8
Sensitivity	5	Sensitivity	5	Pulse width	500 ms	1
Phase coarse	0	Phase coarse	0	Pulse delay	0
Phase fine	0	Phase fine	0	Amplitude	7
Gain for InGaAs sensor	70	Gain for Si sensor	30	Frequency	1.273 kHz

$T$ (°C)	S1 (Volt)	S2 (Volt)	S2/S1
1600	2.67	4.27	1.60
1550	2.44	3.74	1.54
1500	2.20	3.07	1.40
1450	1.98	2.49	1.26
1400	1.77	2.02	1.14
1350	1.55	1.60	1.02
1250	1.23	1.05	0.85
1200	1.02	0.80	0.79
1150	0.88	0.61	0.70
1100	0.72	0.48	0.66
1050	0.60	0.34	0.57
1000	0.50	0.26	0.52
950	0.42	0.18	0.44
900	0.36	0.15	0.41
850	0.29	0.10	0.35
800	0.27	0.09	0.33

$T$	Method	Equation of the Calibration Curve	$R^{2}$
T1 (from S1)	Logarithmic assumption:	$330.08 * l n (S 1) + 1225.25$	$R^{2} = 0.9899$
	Eq. (3)—Planck’s model:	$1 / (- 25.08 E - 5 * l n (S 1) + 85.35 E - 5)$	$R^{2} = 0.9843$
T2 (from S2)	Logarithmic assumption:	$197.69 * l n (S 2) + 1269.82$	$R^{2} = 0.9933$
	Eq. (3)—Planck’s model:	$1 / (- 14.96 E - 5 * l n (S 2) + 81.95 E - 5)$	$R^{2} = 0.9832$
T3 (from the S2/S1 ratio)	Logarithmic assumption:	$492.25 * \ln (S 2 / S 1) + 1335.91$	$R^{2} = 0.9958$
T3 (from the S2/S1 ratio)	Eq. (4)—Planck’s model:	$1 / (- 37.07 E - 5 * l n (S 2 / S 1) + 76.98 E - 5)$	$R^{2} = 0.9784$

	Measured Temperature Readings	Measured Temperature Readings	Measured Temperature Readings
True temperature (°C)	(accuracy%) from InGaAs Detector	(accuracy%) from Si Detector	(accuracy%) from Si/InGaAs Ratio
1600 Using logarithmic	$1470.36^{\circ} C \pm 5.26^{\circ} C (\pm 8.10 %)$	$1563.39^{\circ} C \pm 2.99^{\circ} C (\pm 2.29 %)$	$1701.37^{\circ} C \pm 6.14^{\circ} C (\pm 6.34 %)$
1600 Using Planck’s model	$1498.71^{\circ} C \pm 8.79^{\circ} C (\pm 6.33 %)$	$1674.11^{\circ} C \pm 6.36^{\circ} C (\pm 4.63 %)$	$2022.10^{\circ} C \pm 18.91^{\circ} C (\pm 26.38 %)$
850 Using logarithmic	${751.77}^{\circ} C \pm 26.98^{\circ} C (\pm 11.56 %)$	$804.78^{\circ} C \pm 16.25^{\circ} C (\pm 5.33 %)$	$884.07^{\circ} C \pm 50.56^{\circ} C$ ( $\pm 5.60 %$ )
850 Using Planck’s model	${824.46}^{\circ} C \pm 13.90^{\circ} C (\pm 3.03 %)$	$853.76^{\circ} C \pm {9.04}^{\circ} C (\pm 0.86 %)$	$901.92^{\circ} C \pm 31.33^{\circ} C$ ( $\pm 6.15 %$ )

$T$ (°C)	S1 (Volt)	S2 (Volt)
1074	2.62	2.82
1058	2.39	2.45
1045	2.27	2.34
1027	2.05	2.17
1015	2.08	2.42
936	1.43	0.76
880	1.12	0.54

Cooling System Temperature (°C)	Error for InGaAs Measurement (%)	Error for Si Measurement (%)
5	9.51	3.12
10	8.03	1.53
15	8.10	2.29
20	9.71	2.72
25	9.87	3.23

Cooling System Temperature (°C)	Error for InGaAs Measurement (%)	Error for Si Measurement (%)
5	9.51	3.12
10	8.03	1.53
15	8.10	2.29
20	9.71	2.72
25	9.87	3.23

Abstract

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Applied Optics