Abstract

Traces of impurity may be determined by solution of the sample followed by complete coprecipitation with a carrier under conditions such that the original matrix is not precipitated. The impurity is then determined by d c. arc spectroscopy, using the carrier as internal standard. The method is of use for the determination of traces too low for normal methods, and for the analysis of trace standards for conventional metallic sample methods where no purely chemical method exists.

Detection of subsurface trace impurity in polished fused silica with biological method

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Numerical determination of ray tracing: a new method

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Spectrographic Determination of Trace Elements in 70/30 Brass and Admiralty Brass. Part I*

P. A. Leichtle
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A Method of Spectrographic Analysis of Impurities in Materials for Oxide Coating of Thermionic Cathodes*

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