Abstract
We have used a laser frequency comb with a repetition frequency of to measure the drift and dispersion of a Fourier-transform spectrometer (FTS). We used the electronic measurements of and to create a reference line list. We measured 28 interferograms and computed the phase and power spectra. The analysis of the interferograms and phase spectra allowed for compensation of several spectroscopic artifacts. In the computed power spectra, we detected suitable lines in the near-infrared bandwidth . The residual dispersion of the FTS can be described by two factors, a linear dispersion and a constant offset. Both are highly correlated and need to be computed simultaneously. The factors were computed from the comparison of a reference with measured line lists. The linear dispersion factor is found to be varying on the order of , while the constant offset is of the order of . Using two factors for calibration, the difference between the reference and the measured line list can be removed completely with an uncertainty of corresponding to a precision of .
© 2019 Optical Society of America
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