Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Water Film Thickness Imaging based on Time-Multiplexed Near-Infrared Absorption

Not Accessible

Your library or personal account may give you access

Abstract

We demonstrate the imaging of water film thickness at constant temperature by exploiting absorbance ratios of near-infrared (NIR) radiation at two wavelengths in the water absorption spectrum around 1400 nm with light delivered by diode lasers and signal registered by a fast framing InGaAs focal plane array camera. Measurements are performed in reflection mode from opaque film support surfaces.

© 2018 The Author(s)

PDF Article
More Like This
DLAS-based measurement of water film thickness in retro-reflection

R. Pan, C. Brocksieper, J.B. Jeffries, T. Dreier, and C. Schulz
JW1F.4 3D Image Acquisition and Display: Technology, Perception and Applications (3D) 2016

Thickness imaging of evaporating liquid water films by simultaneous Tracer-LIF, Raman imaging and Diode Laser Absorption Spectroscopy

D. Greszik, H. Yang, T. Dreier, and C. Schulz
LT3B.2 Laser Applications to Chemical, Security and Environmental Analysis (LACSEA) 2012

Near Infrared Imaging of Human Prostate Cancerous and Normal Tissues Based on Water Absorption

W. B. Wang, J. H. Ali, M. Zevallos, and R. R. Alfano
WF38 Biomedical Topical Meeting (BIO) 2004

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2022 | Optica Publishing Group. All Rights Reserved