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Water Film Thickness Imaging based on Time-Multiplexed Near-Infrared Absorption

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We demonstrate the imaging of water film thickness at constant temperature by exploiting absorbance ratios of near-infrared (NIR) radiation at two wavelengths in the water absorption spectrum around 1400 nm with light delivered by diode lasers and signal registered by a fast framing InGaAs focal plane array camera. Measurements are performed in reflection mode from opaque film support surfaces.

© 2018 The Author(s)

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