Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Parametrization of a Subaperture Polishing Tool -Analysis of the Path Tests

Not Accessible

Your library or personal account may give you access


For a removal simulation of a subaperture polishing process, the error measurement, the processing path and the removal characteristics of the tool are used as input. To determine the removal characteristics of the tool, typical path tests will be done. The problems in analyzing the measurement results and a possible analysis software solution are presented in this paper.

© 2017 Optical Society of America

PDF Article
More Like This
A General Tool for the Design and Analysis of Stressed Optic Polishing

Victor Genberg, Gregory Michels, Keith Doyle, and Gary Bisson
OFMC11 Optical Fabrication and Testing (OFT) 2006

Subaperture-polishing with variable spots

Sebastian Draxinger, Christine Wünsche, and Rolf Rascher
FT3B.4 Freeform Optics (Freeform) 2013

Fiber Based Polishing Tools for Optical Applications

Hossein Shahinian and Brigid Mullany
OTu2B.4 Optical Fabrication and Testing (OFT) 2017


You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
Login to access Optica Member Subscription

Select as filters

Select Topics Cancel
© Copyright 2022 | Optica Publishing Group. All Rights Reserved