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Carrier-Envelope Phase Noise Increment Due to Thermal Issues of a Ti:Sapphire-Based Amplifier

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Thermal instability-related noise of carrier-envelope phase (CEP) of pulses are measured in a three-pass amplifier separately from the oscillator, resulting in an increase of <100mrad noise depending on the repetition rate, cooling and pumping conditions.

© 2013 Optical Society of America

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