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Conferences > BIO > 2002 > MI > MI1

Classification of Skin Abnormalities Using Oblique-Incidence Diffuse Reflectance Spectroscopy

A. Garcia-Uribe, N. Kehtarnavaz, G. Marquez, M. Mehrubeoglu, V. Prieto, M. Duvic, and L. V. Wang

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Abstract

This paper presents a technique for classifying skin abnormalities using oblique- incidence diffuse reflectance spectroscopy. The objective is to provide a non-invasive computer- assisted tool to dermatologists for lowering the number of unnecessary biopsies.

© 2002 Optical Society of America

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