Abstract
The lateral temperature distribution in broad-area laser diodes and laser diode arrays has a significant impact on the near-field and far-field emission characteristics under continuous (cw) operation.1 In broad-area traveling-wave amplifiers, the lateral temperature variation ΔTc in the active region leads to thermal lensing2 which can result in severe degradation of the far-field (FF) distribution of the amplified beam. Diffraction-limited broad-area amplifiers have emitted up to 12 W in pulsed conditions,3 but have been demonstrated only up to 0.5 W cw.4
© 1992 Optical Society of America
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