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Conferences > CLEO > 2003 > CThJ > CThJ6
  • Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference
  • Technical Digest (Optica Publishing Group, 2003),
  • paper CThJ6

Measurement of Q Degradation due to PMD Using Importance Sampling

L.-S. Yan, M.C. Hauer, P. Ebrahimi, Y. Wang, A. E. Willner, Y. Q. Shi, X. Steve Yao, and W. L. Kath

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Abstract

We use multiple importance-sampling (IS) to measure the Q degradation due to PMD emulated by three programmable DGD elements with uniform polarization-coupling between sections. The measured Q-penalty probability distribution extends to <10−17 with only 1800 samples. Without IS, >1017 samples are required to examine such low-probability events.

© 2003 Optical Society of America

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