Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
  • The Pacific Rim Conference on Lasers and Electro-Optics
  • Technical Digest Series (Optica Publishing Group, 1995),
  • paper P31

Extremely sensitive element analysis by laser ablation atomic fluorescence spectroscopy

Not Accessible

Your library or personal account may give you access

Abstract

UV laser ablation is known as a useful processing technique for micro-electronics devices. It can be used for the sensitive laser mass spectroscopy, too. In this paper, we proposed a novel technique to detect trace elements in materials very sensitively, using the UV laser ablation coupled with the laser induced fluorescence (LIF) spectroscopy. We call it the LAAF (Laser ablation atomic fluorescence) spectroscopy. With this technique, sub-ppt (pg/m) level detection was demonstrated for Na atoms in water.

© 1995 IEEE

PDF Article
More Like This
Analysis of trace element in solids by using laser ablation atomic fluorescence spectroscopy

M.-K. Kim, H. Ishii, T. Takao, Y. Oki, and M. Maeda
CThO4 Conference on Lasers and Electro-Optics (CLEO:S&I) 2000

Nanometer-scale surface analysis by laser-ablation fluorescence spectroscopy

Yuji Oki, Mitsuo Maeda, and Akira Hirano
CWP6 Conference on Lasers and Electro-Optics (CLEO:S&I) 1996

Nanoscale and femtogram trace element analysis using soft laser ablation fluorescence spectroscopy

Yuji Oki, Takayuki Takao, Takashi Higotani, Daisuke Nakamura, and Mitsuo Maeda
CThY2 Conference on Lasers and Electro-Optics (CLEO:S&I) 2003

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.