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  • The 4th Pacific Rim Conference on Lasers and Electro-Optics
  • Technical Digest Series (Optica Publishing Group, 2001),
  • paper P2_61

SIMS Analysis of CH4-ECR-Plasma-Irradiated GaInAsP/InP for Low Surface Recombination in Micro Light Emitters

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Abstract

We confirmed the reduction in surface recombination of 1.55-μm-GaInAsP/InP micro light emitters by the CH4-ECR-plasma irradiation. The SIMS analysis suggested that this effect was provided by shallowly implanted C, which possibly formed a deep level that electrically insulate near the surface.

© 2001 IEEE

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