Effects of optical polarization in reflection-mode near-field optical microscopy

K. Sasagawa; H. Yoshida; T. Tokuda; J. Ohta; M. Nunoshita

The 4th Pacific Rim Conference on Lasers and Electro-Optics
Technical Digest Series (Optica Publishing Group, 2001),
paper P2_64

Effects of optical polarization in reflection-mode near-field optical microscopy

K. Sasagawa, H. Yoshida, T. Tokuda, J. Ohta, and M. Nunoshita

Conference on Lasers and Electro-Optics/Pacific Rim 2001

Chiba Japan
15–19 July 2001
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Poster Session 2 [Room E] (P2)

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K. Sasagawa, H. Yoshida, T. Tokuda, J. Ohta, and M. Nunoshita, "Effects of optical polarization in reflection-mode near-field optical microscopy," in The 4th Pacific Rim Conference on Lasers and Electro-Optics, Technical Digest Series (Optica Publishing Group, 2001), paper P2_64.

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Abstract

The polarization dependence of reflection-mode SNOM observation is characterized. An Al/glass grating with a fine structure is observed by SNOM. SNOM images observed with parallel-and perpendicular-polarized light show different feature each other. The difference is also studied by means of computer simulations.

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