Measurement of dispersion in a silicon waveguide at 1.5 μm

T. K. Liang; H. K. Tsang; S. W. Roberts; D. J. Brady; A. Harpin; J. Drake; M. Asghari

The 4th Pacific Rim Conference on Lasers and Electro-Optics
Technical Digest Series (Optica Publishing Group, 2001),
paper ThJ1_5

Measurement of dispersion in a silicon waveguide at 1.5 μm

T. K. Liang, H. K. Tsang, S. W. Roberts, D. J. Brady, A. Harpin, J. Drake, and M. Asghari

Conference on Lasers and Electro-Optics/Pacific Rim 2001

Chiba Japan
15–19 July 2001
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Ultrafast Optical Devices [Room J] (ThJ1)

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T. K. Liang, H. K. Tsang, S. W. Roberts, D. J. Brady, A. Harpin, J. Drake, and M. Asghari, "Measurement of dispersion in a silicon waveguide at 1.5 μm," in The 4th Pacific Rim Conference on Lasers and Electro-Optics, Technical Digest Series (Optica Publishing Group, 2001), paper ThJ1_5.

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Abstract

We report for the first time measurements of the dispersion coefficient in a silicon waveguide at 1.5 μm wavelength. The total dispersion was found to be only −9.1 fs/[nm.cm].

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