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  • The 4th Pacific Rim Conference on Lasers and Electro-Optics
  • Technical Digest Series (Optica Publishing Group, 2001),
  • paper TuG2_1

Fast and accurate characterization of optical components using low-coherence interferometry*

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Abstract

Low-coherence interferometry yields a high-resolution measurement of a component’s spectral and dispersion properties. We show that this technique can be applied to cascaded components, and this measurement is not adversely affected by other components in the system.

© 2001 IEEE

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