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Conferences > CLEOPR > 2022 > P_CTh6 > P_CTh6_14

Step Height Measurement via Vortex Beam Diffraction

Dina Grace C. Banguilan and Nathaniel P. Hermosa

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Abstract

We measure the height of a single reflective step through vortex beam diffraction by a triangular aperture. By calculating the SSIM index between the patterns, we can identify theoretically within 0 to λ/4 height difference.

© 2022 IEEE

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