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Conferences > CLEO_AT > 2022 > ATh1D > ATh1D.1

Free-form and Large Lens Characterization Using At-focus Scanning Ptychographic Metrology

Bojana Ivanic, Jeremy Goeckeritz, David Goldberger, Jonathan Barolak, and Daniel E. Adams

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Abstract

Here we implement and test a new ptychographic metrology for characterization of large optical components, including transmissive and reflective systems. As proof of concept, we present the phase and transmission profile of a short focus, aberrated lens.

© 2022 The Author(s)

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