Abstract

This work is development of spectropolarization nephelometry technique which allows to investigate the most essential mechanisms of formation of radiation flux reflected by the plant leaf: the specular reflection on the leaf surface, the singly and multiply scattering on intraleaf structure elements, the chlorophyll molecular absorption, and the cuticle refraction of radiation going out from the leaf. It was found that the polarization characteristics are more sensitive to the changes of plant structure as compared with the traditionally measured bidirectional reflectance factors. A spectral shift of a maximum of the polarization degree angular function have been discovered and theoretically substantiated.

© 1996 IEEE