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The polarization characteristics of radiation reflected by the plant leaves are most sensitive to the changes of plant structure as compared with the other factors. Studies of the spectropolarization characteristics angular dependencies of radiation reflected by the plant leaves allow to investigate the mechanisms of reflected radiation flux formation: the specular reflection on the leaf surface, the singly and multiply scattering within leaf, the leaf pigment absorption, and the cuticle refraction of radiation going out from the leaf.
© 1998 IEEE
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