Abstract

Scanning Nearfield Optical Microscopy is a relatively young method for viewing materials with a resolution not previously attainable with optical techniques. This microscopy overcomes the conventional Abbe barrier, or diffraction limit, of resolution and allows to enter new optical-characterization fields with submicron resolution. Studies of organic materials using this technique can be found in various fields starting with brightfield imaging of polymer surfaces as well as using fluorescence and polarization contrast. Specific setups of the instrument concerning the sensitivity of detection are even able to study single molecules.

© 1996 IEEE