Abstract
In optical interconnection and high quality analog transmission systems relative intensity noise (RIN) characteristics of vertical cavity surface emitting lasers (VCSELs) are important since RIN imposes limitations on receiver sensitivity and bit error rates. In the past, only a few investigations have been dedicated to the noise spectra of VCSELs, especially under distant optical feedback, which is inherently present in low cost optical interconnects. The investigated 850 nm single mode VCSELs were fabricated by solid source MBE for multi-Gbit/s data rate optical transmission systems [1].
© 1998 IEEE
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