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Studying interfaces in thin films is essential for optical coating due to possible defects, which can arise during deposition and can influence the optical and even mechanical properties of these films. At the same time, standard characterization methods lack the ability to study nanometer-thin interfaces buried below the surface. One of the methods to overcome this limitation is the method that uses SHG on thin films. Nevertheless, SHG from thin films depends on many factors, and in certain cases, it might not even be stable in time.
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