Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
  • Conference on Lasers and Electro-Optics/Europe (CLEO/Europe 2023) and European Quantum Electronics Conference (EQEC 2023)
  • Technical Digest Series (Optica Publishing Group, 2023),
  • paper cm_5_5

Three-Temperature Modeling of Laser Excitation in Silicon and Parametric Dependence of Damage Threshold

Not Accessible

Your library or personal account may give you access

Abstract

Laser processing of semi-conductors such as silicon has numerous applications in nano-structuring and fabrication industry, and requires a detailed understanding of the dynamics. The interaction involves complex processes such as photo-absorption, recombination, impact ionization and re-distribution of the energy due to carrier-phonon dynamics. Numerical modeling proves to be useful in understanding the physics of the interaction. Based on the density-dependent Two-Temperature model (nTTM) [1], we have developed a one-dimensional Three-Temperature model (1D-3TM) and studied the laser-excitation process and damage in silicon [2]. In 1D-3TM, three subsystems for electrons, holes and the lattice are considered and their evolution dynamics are calculated separately. This approach gives a more clear picture of the electron dynamics and the evolution of quasi-temperatures in the system. We also take into account the evolution of optical properties of silicon during the interaction and the effect of band-gap re-normalization on them. The laser field is modeled using finite difference time domain (FDTD) method [2].

© 2023 IEEE

PDF Article
More Like This
Parametric dependence of laser induced damage threshold in silicon

Prachi Venkat and Tomohito Otobe
23p_C205_2 JSAP-Optica Joint Symposia (JSAP) 2022

Effect of laser and target parameters on excitation dynamics and damage in silicon

Prachi Venkat and Tomohito Otobe
STh1N.5 CLEO: Science and Innovations (CLEO:S&I) 2023

Numerical study of laser excitation in Silicon using Three-Temperature model

Prachi Venkat and Tomohito Otobe
JTh3B.9 CLEO: Applications and Technology (CLEO:A&T) 2022

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.