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Manipulating the Refractive Index of a Fabry-Perot Nanocavity Comprising Thin Semiconductor and Metal Films Using an External Electric Potential

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Abstract

Reflectance of multilayer thin-film can be calculated using the refractive index and layer thickness by transfer matrix method. We show the effects of electric potential on the refractive index of multilayer thin-film made of Au-pInSb-TiO2-Au.

© 2023 The Author(s)

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