Two-Step Hot Electron Decay in Ti1-xAlxN Films

I Hong Ho; Ching-Wen Chang; Shangjr Gwo; Hyeyoung Ahn

doi:10.1364/CLEO_AT.2023.JW2A.19

CLEO 2023
Technical Digest Series (Optica Publishing Group, 2023),
paper JW2A.19
•https://doi.org/10.1364/CLEO_AT.2023.JW2A.19

Two-Step Hot Electron Decay in Ti_1-xAl_xN Films

I Hong Ho, Ching-Wen Chang, Shangjr Gwo, and Hyeyoung Ahn

CLEO: Fundamental Science 2023

San Jose, CA United States
7–12 May 2023
ISBN: 978-1-957171-25-8

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Joint Poster Session II (JW2A)

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I. H. Ho, C. Chang, S. Gwo, and H. Ahn, "Two-Step Hot Electron Decay in Ti1-xAlxN Films," in CLEO 2023, Technical Digest Series (Optica Publishing Group, 2023), paper JW2A.19.

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Abstract

We report two-step electron-phonon interaction process in MBE-grown Ti_1-xAl_xN thin films. Strong and ultrafast (<0.2 ps) as well as long-living (≥1 ns) electron-phonon interaction is observed for Ti-rich Ti_1-xAl_xN in the whole visible spectral range.

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