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Conferences > CLEO_SI > 2020 > SM1M > SM1M.7

Electro-optic frequency combs for atomic and physical metrology

David A Long, Benjamin J. Reschovsky, Feng Zhou, Yiliang Bao, Ramgopal Madugani, Adam J. Fleisher, Jason J. Gorman, and Thomas W. LeBrun

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Abstract

Electro-optic frequency combs provide a powerful and agile platform for rapid sensing. We describe new approaches for the generation and application of these combs and utilize them in a range of metrological systems.

© 2020 The Author(s)

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