Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
Conferences > CLEO_SI > 2023 > SM4H > SM4H.2

Rapid Multiplex Ultrafast Nonlinear Microscopy for Advanced Material Characterization

Torben L. Purz, Blake T. Hipsley, Eric. W. Martin, Ronald Ulbricht, and Steven T. Cundiff

Not Accessible

Your library or personal account may give you access

Abstract

We demonstrate rapid four-wave mixing (FWM) imaging to assess the quality of emerging optical and electronic materials. We show that FWM intensity, dephasing times, and excited state lifetimes are accurate sample quality indicators.

© 2023 The Author(s)

PDF Article
More Like This
Nonlinear nano-optics and ultrafast nano-imaging of electronic coherence in monolayer WSe2

Wenjin Luo, Benjamin G. Whetten, Vasily Kravtsov, Ashutosh Singh, Yibo Yang, Di Huang, Xinbin Cheng, Tao Jiang, Alexey Belyanin, and Markus B. Raschke
FF2G.6 CLEO: Fundamental Science (CLEO:FS) 2023

Coherent Imaging Spectroscopy of van-der Waals Materials

Torben L. Purz
LM1F.2 Laser Science (LS) 2023

Rapid Determination of Layer Number in Two-dimensional Materials using Four-wave Mixing Spectroscopy

Torben L. Purz, Eric W. Martin, Adam Alfrey, Yuhang Cao, Hui Deng, and Steven T. Cundiff
JM4A.51 Frontiers in Optics (FiO) 2023

View More...
Select as filters
Select Topics Cancel
Top
       
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.
Privacy | Terms of Use