aPIE: Angle calibration algorithm for reflection ptychography

Anne C.C. De Beurs; Anne C.C. De Beurs; Lars Loetgering; Lars Loetgering; Lars Loetgering; Milan Herczog; Milan Herczog; Kjeld S.E. Eikema; Kjeld S.E. Eikema; Stefan Witte; Stefan Witte

doi:10.1364/COSI.2021.CW6B.4

OSA Imaging and Applied Optics Congress 2021 (3D, COSI, DH, ISA, pcAOP)
OSA Technical Digest (Optica Publishing Group, 2021),
paper CW6B.4
•https://doi.org/10.1364/COSI.2021.CW6B.4

aPIE: Angle calibration algorithm for reflection ptychography

Anne C.C. De Beurs, Lars Loetgering, Milan Herczog, Kjeld S.E. Eikema, and Stefan Witte

Computational Optical Sensing and Imaging 2021

Washington, DC United States
19–23 July 2021
ISBN: 978-1-943580-89-7

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Ptychography III (CW6B)

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A. C. C. De Beurs, L. Loetgering, M. Herczog, K. S. E. Eikema, and S. Witte, "aPIE: Angle calibration algorithm for reflection ptychography," in OSA Imaging and Applied Optics Congress 2021 (3D, COSI, DH, ISA, pcAOP), H. Hua, B. Javidi, M. Martinez-Corral, O. Matoba, A. Stern, S. Thibault, T. Alieva, J. Ke, F. Willomitzer, F. Okten, P. Silveira, P. Banerjee, E. Stoykova, D. Chu, J. Park, F. Imai, C. Joo, M. Digman, D. Gardner, S. Gladysz, D. LeMaster, S. Basu, and O. Korotkova, eds., OSA Technical Digest (Optica Publishing Group, 2021), paper CW6B.4.

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Abstract

We demonstrate a tilt angle self-calibration technique for reflection mode ptychography. Experiments show accurate angle retrieval and improved image reconstruction, with spatially structured beams outperforming beams with smooth profiles.

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