Field-of-view extension and XY-drift correction in microscopy for large samples

Alejandro Silva; Miguel Arocena; Julia R. Alonso

doi:10.1364/COSI.2022.CTu4F.6

Imaging and Applied Optics Congress 2022 (3D, AOA, COSI, ISA, pcAOP)
Technical Digest Series (Optica Publishing Group, 2022),
paper CTu4F.6
•https://doi.org/10.1364/COSI.2022.CTu4F.6

Field-of-view extension and XY-drift correction in microscopy for large samples

Alejandro Silva, Miguel Arocena, and Julia R. Alonso

Computational Optical Sensing and Imaging 2022

Vancouver, British Columbia Canada
11–15 July 2022
ISBN: 978-1-957171-09-8

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Advances in Computational Microscopy I (CTu4F)

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A. Silva, M. Arocena, and J. R. Alonso, "Field-of-view extension and XY-drift correction in microscopy for large samples," in Imaging and Applied Optics Congress 2022 (3D, AOA, COSI, ISA, pcAOP), Technical Digest Series (Optica Publishing Group, 2022), paper CTu4F.6.

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Abstract

We propose a method for sample XY-drift correction by means of feature detection and correlation analysis along with field-of-view extension for large sample images taken through a microscope with a motorized XY stage

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