Abstract

The diamond films produced by enhanced chemical vapor deposition (CVD) technique have been used to fabricate the radiation detectors. The polycrystalline diamond films have a measured resistivity ~ 10¹⁵ Ω cm. We report the characterization of the detectors made from CVD diamond thin (~ 20 μm) films. The response of the detectors to a flux of X-ray photons produced by an X-ray tube was investigated. The detector response to X-ray flux is almost linear. These results show that CVD diamond film detectors can be used for X-ray flux and dose measurements.