Abstract

Since etched microlenses are produced by digital technology, it is inherently easy to fabricate optics customized for a particular application. However, optimization of wavefront sensors requires an ability to predict their complex behavior. In previous work,^1,2 we demonstrated binary microlens arrays for wavefront sensing in a visible wavelength tomographic imaging system. An eight-view tomographic system based on microlens array sensors is now operational and is described in a separate paper at this conference.³ The current paper addresses error budgeting and optimal design for wavefront sensors; it describes modeling and test procedures and illustrates one design approach.

© 1996 Optical Society of America