Abstract
Aluminium nitride is a promising photonic material from the ultra-violet to the mid-infrared spectral range. We present spectroscopic ellipsometry of sputtered AlN thin films on insulator in the spectral range 0.19 µm - 25 µm, surface roughness characterization, waveguide and grating coupler designs at telecom wavelength.
© 2022 The Author(s)
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