Reflected second-harmonic ellipsometry—A new tool for determining the nonlinear optical coefficients of thin films

T. Kondo; S. Koh; T. Tsunoda; A. Okubo; A. Okubo; Y. Shiraki; Y. Shiraki; R. Ito

European Quantum Electronics Conference
Technical Digest Series (Optica Publishing Group, 1994),
paper QThL1

Reflected second-harmonic ellipsometry—A new tool for determining the nonlinear optical coefficients of thin films

T. Kondo, S. Koh, T. Tsunoda, A. Okubo, Y. Shiraki, and R. Ito

European Quantum Electronics Conference 1994

Amsterdam Netherlands
28 August–2 September 1994
ISBN:

From the session
Second-Order Nonlinear Effects (QThL)

Not Accessible

Your library or personal account may give you access

Get PDF
Email
Share
Get Citation
Copy Citation Text
T. Kondo, S. Koh, T. Tsunoda, A. Okubo, Y. Shiraki, and R. Ito, "Reflected second-harmonic ellipsometry—A new tool for determining the nonlinear optical coefficients of thin films," in European Quantum Electronics Conference, Technical Digest Series (Optica Publishing Group, 1994), paper QThL1.

Export Citation
- BibTex
- Endnote (RIS)
- HTML
- Plain Text
Save article

Abstract

III-V semiconductors are promising nonlinear optical materials for frequency conversion devices.^1-3 These devices are based on quasi-phase-matching that is achieved by spatially modulating the quadratic optical nonlinearity.

PDF Article

More Like This

Second-Order Nonlinear Optical Properties of Wide-Bandgap Semiconductors

Takashi Kondo, Kaoru Morita, and Ryoichi Ito
NThE.23 Nonlinear Optics: Materials, Fundamentals and Applications (NLO) 1996

Second-harmonic generation in rf sputter- deposited AIN thin films

P. M. Lundquist, W. P. Lin, E. D. Rippert, J. B. Ketterson, and C. K. Wong
JThC2 Conference on Lasers and Electro-Optics (CLEO:S&I) 1994

Quadratic Nonlinear Optical Coefficient of AlxGai-xAs Thin Film

M. Ohashi, T. Kondo, R. Ito, S. Fukatsu, Y. Shiraki, K. Kumata, and S. S. Kano
MD2 Nonlinear Optics (NLO) 1992

Previous Article Next Article