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Diagnostics for XUV/Soft X-ray Laser

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Abstract

We have begun investigating the production of an XUV/soft x-ray laser using our high-powered glass lasers as drivers. A major diagnostic for lasing is the measure of the absolute power produced in the lasing line. I have developed a spectrograph to time-resolve lasing lines in the energy range from 50 eV to greater than 200 eV. The spectrograph combines a transmission grating and x-ray streak camera to produce a flat field instrument. A cylindrical mirror is used in front of the grating to image the source and act as a collecting optic. The efficiency of the components are calibrated so that absolute intensities can be measured. I will compare the performance of this instrument with reflection grating systems. I will also discuss planned improvements to the system which should increase total throughput, image quality, and resolving power.

© 1984 Optical Society of America

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