Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

A Facility for the Measurement of the Soft X-ray Reflectivity Spectrum of XUV and Soft X-ray Mirrors

Not Accessible

Your library or personal account may give you access

Abstract

The spectrally resolved reflectivity coefficient of multilayer mirrors is measured in the EUV-soft X-ray spectral region. A laser produced plasma (LPP) acts as a bright source of continuous spectrum radiation, and it is used to light the multilayer mirror under test. The reflected rays are collected by a grazing incidence toroidal mirror and focused in the entrance slit of a grazing incidence spectrograph, where the spectrum is detected. The ratio of such spectrum with that obtained with the direct collection of the LPP spectrum, corrected for the higher diffraction orders contributions, is the spectrum of the absolute reflectivity coefficient for the mirror[1].

© 1994 Optical Society of America

PDF Article
More Like This
Diagnostics for XUV/Soft X-ray Laser

Robert L. Kauffman
TuC4 Laser Techniques in the Extreme Ultraviolet (EUVS) 1984

Si/B4C Soft X-Ray Multilayer Mirrors

Charles M. Falco, Brian S. Medower, and J. M. Slaughter
ThA.5 Physics of X-Ray Multilayer Structures (PXRAYMS) 1994

MO-SI MULTILAYER AS SOFT X-RAY MIRRORS FOR THE WAVELENGTHS AROUND 20 NM REGION

D. Kim, H.W. Lee, J. J. Lee, J. H. Je, M. Sakurai, and M. Watanabe
MC.8 Physics of X-Ray Multilayer Structures (PXRAYMS) 1994

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.