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Conferences > EUVXRAY > 2022 > EW4A > EW4A.2

Reflection Ptychography via Auto Differentiation on a High Harmonic EUV beamline

Sven Weerdenburg, Yifeng Shao, Jacob Seifert, Roland Horsten, and Wim Coene

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Abstract

We demonstrate our beamline using a table-top HHG EUV source for lensless imaging application in reflection m ode. The sample reflection function is reconstructed using an auto-differentiation based ptychographic algorithm built on TensorFlow platform.

© 2022 The Author(s)

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