Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

High NA Pupil Plane Image Polarimetry for Detection of Surface and Subsurface Damage in Optical Materials

Not Accessible

Your library or personal account may give you access

Abstract

A high-NA solid immersion lens microscope in conjunction with polarization modulated pupil plane imaging is investigated as a means for surface and subsurface damage detection in optical materials.

© 2014 Optical Society of America

PDF Article
More Like This
Subsurface Damage Characterization with Nonlinear High Numerical Microscopy

Phat Lu, Youngsik Kim, and Tom D. Milster
JW3A.9 Frontiers in Optics (FiO) 2014

Evaluation of Subsurface Damage and Surface Roughness by Light Scattering Techniques

Marcus Trost, Sven Schröder, and Angela Duparré
OTh3B.6 Optical Fabrication and Testing (OFT) 2014

Effect of forbidden light on subsurface IC imaging

Aydan Uyar, Abdulkadir Yurt, T. Berkin Cilingiroglu, Bennett B Goldberg, and M. Selim Ünlü
FTu1G.2 Frontiers in Optics (FiO) 2014

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2022 | Optica Publishing Group. All Rights Reserved