Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
Conferences > FiO > 2023 > JM7A > JM7A.71

Study of Frequency Manipulations of Depletion Pattern in 2D SIM based on both Structured Excitation and Stimulated Emission Depletion Material

Anupriya Tiwari and Joby Joseph

Not Accessible

Your library or personal account may give you access

Abstract

This paper presents simulation studies on the harmonic strength of two-dimensional Structured Illumination microscopy based on structured excitation and structured stimulated emission depletion due to variations in the frequency of structured depletion pattern with respect to excitation pattern.

© 2023 The Author(s)

PDF Article
More Like This
Optical resolution enhancement and background reduction by stimulated emission depletion structured illumination microscopy with structured excitation

Fumihiro Dake, Shigeru Nakayama, and Yusuke Taki
NM2C.4 Novel Techniques in Microscopy (NTM) 2015

Nonlinear Structured Illumination Microscopy with Surface Plasmon Resonance Enhanced Stimulated Emission Depletion

Han Zhang, Ming Zhao, and Leilei Peng
NM4B.1 Novel Techniques in Microscopy (NTM) 2013

Depletion Dynamics for Stimulated Emission Depletion (STED) Microscopy

Margaret C. Chiang, Juan C. Garcia, and Jia-Ming Liu
CFT4 Conference on Lasers and Electro-Optics (CLEO:S&I) 2008

View More...

Poster Presentation

Media 1: PDF (569 KB)     
Select as filters
Select Topics Cancel
Top
       
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.
Privacy | Terms of Use