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Characterization of Optoelectronic Response of Metal-Semiconductor-Metal Structures by Ultrafast Photocurrent Imaging

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Abstract

Capability of high-resolution mapping of ultrafast photoconductivity in metal-semiconductor-metal micro- and nanostructures can substantially advance photonics research. We report micrometer-resolution photocurrent mapping of structures driven by femtosecond laser to characterize their response to ultrafast excitation.

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