Abstract
The transverse interference method has been used as nondestructive index profiling of thin optical fibers1),2),3). It is difficult, however, to apply this method to thick samples such as distributed idnex rod lenses and preform rods, since the fringe shift is so large that it overflows from the field of the interference microscope.
© 1981 Optical Society of America
PDF ArticleMore Like This
Kenichi Iga
MC1 Gradient-Index Optical Imaging Systems (GIOIS) 1981
T. W. Cline and R. B. Jander
MD1 Gradient-Index Optical Imaging Systems (GIOIS) 1981
K. Iga, M. Oikawa, and T. Sanada
TuB2 Gradient-Index Optical Imaging Systems (GIOIS) 1981