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Estimation of Planar Microlens by Oblique Ray Tracing

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Abstract

We presented the meridional ray tracing method for a planar microlens with 3-D distributed index and aspheric boundaries, and estimated its N.A. and spherical aberration1),2). But the off-axial characteristics of this lens has not been estimated. In this paper, we aim to estimate a planar microlens by more general ray tracing which includes the calculation of path length.

© 1987 Optical Society of America

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