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Characterization of a flatfield spectrometer for the VUV- and XUV-spectral range

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Abstract

High order harmonic generation of intense femtosecond laser pulses has attracted much interest during the last years. These harmonics cover a rather broad spectral range and especially in the VUV and XUV (corresponding to wavelengths from approximately 10 100 nm) the spectral analysis and the efficient detection of the laser generated radiation is not a trivial task. For our own studies on harmonic generation from femtosecond laser plasmas on solid surfaces we have build a XUV-spectrometer consisting of a flatfield grating in conjunction with a thinned, back-illuminated CCD-camera.

© 1997 Optical Society of America

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