Abstract

Integrated guided-wave optical devices formed from Ti:LiNbO₃ are being investigated for measurement and/or analog processing of optical wave fronts. An integrated optical device consisting of an array of interferometers and straight wave guides for wave front measurement is the first such device whose performance is being evaluated.’ Concepts on how to vary the phase contour and/or the intensity contour (apodize) of the wave front are under study. In analog processing high accuracy in the output (to up to three significant figures) is desirable. Thus uniformity and reproducibility are of paramount importance. This paper reports on this uniformity and reproducibility obtained for wave front measurement sensors. To show the applicability of Ti:LiNbO₃ for analog processing throughout its transparent range of ≈0.4-4.0 μm, wave front measurement sensors have been fabricated for GaAs lasers (0.82 μm), IR He–Ne lasers (3.39 μm), and argon lasers (0.458 μm).

© 1986 Optical Society of America