Abstract

Short pulse time domain measurements can provide the basis for a comprehensive diagnostic technology to characterize both nonlinear and linear optical properties of waveguide devices. This paper outlines methods for characterizing waveguide devices using femtosecond time- resolved measurement. These investigation provide fundamental information on linear and nonlinear device behavior. In addition, by developing interferometric measurement techniques we can obtain insights into the mechanisms of all-optical switching in waveguide devices. Based on these studies, we formulate criteria on material properties that must be satisfied to achieve high-speed all-optical switching and discuss performance issues for simple all-optical switching device designs.

© 1991 Optical Society of America