Line-Field White-Light Interferometry for Varied Reflective Surface Imaging

Jaeheung Kim; Sang Min Park; Chang-Seok Kim

doi:10.1364/ISA.2023.IW5E.7

Optica Imaging Congress (3D, COSI, DH, FLatOptics, IS, pcAOP)
Technical Digest Series (Optica Publishing Group, 2023),
paper IW5E.7
•https://doi.org/10.1364/ISA.2023.IW5E.7

Line-Field White-Light Interferometry for Varied Reflective Surface Imaging

Jaeheung Kim, Sang Min Park, and Chang-Seok Kim

Imaging Systems and Applications 2023

Boston, Massachusetts United States
14–17 August 2023
ISBN: 978-1-957171-28-9

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3D and Holography/Interferometry (IW5E)

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J. Kim, S. M. Park, and C. Kim, "Line-Field White-Light Interferometry for Varied Reflective Surface Imaging," in Optica Imaging Congress (3D, COSI, DH, FLatOptics, IS, pcAOP), Technical Digest Series (Optica Publishing Group, 2023), paper IW5E.7.

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Abstract

We propose line-field white-light interferometry (WLI) system that utilizes tunable-path-difference source (TPDS) and signal saturation compensation technique. Our WLI has improved performance in terms image stability, speed, and the capability of varied reflective surface imaging.

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